全选
【符合条件的数据共:2条】
作者:Li, Zixuan^1, Xian, Jiyao^1, Sysoyeva, S.G.^1
关键词:Fracture morphology;GaN layers;...
会议举办机构:National Research Tomsk Polytechnic University, 30 Lenin Ave., Tomsk
会议时间:2019
作者:Grishkov, A.A.^1, Kurkan, I.K.^1,2, Pegel, I.V.^1,2
关键词:Annular electron beam;Axial components;...
会议举办机构:Institute of High Current Electronics', 2/3 Akademichesky Ave., Tomsk
会议时间: